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The data structure returned is:
Table 112: S.M.A.R.T . Data Structure
Offset
Value
Description
0..1
2..361
0004h SMART structure version for firmware revision “1” , “2”, “4”
0010h SMART structure version for firmware “3”
Attribute entries 1 to 30 (12 bytes each)
362
363
00h
00h
Off-line data collection status (no off-line data collection)
Self-test execution status byte (self-test completed)
364..365
366
0000h Total time to complete off-line data collection
00h
367
00h
Off-line data collection capability (no off-line data collection)
368..369
0003h SMART capabilities
370
371
372
373
374..385
00h
00h
00h
00h
00h
Error logging capability (no error logging)
Short self-test routine recommended polling time
Extended self-test routine recommended polling time
Reserved
386..387
388..391
392..395
396
397
398..510
511
0002h SMART Swissbit Structure Version for SMART structure version 0004h
0003h SMART Swissbit Structure Version for SMART structure version 0010h
“Commit” counter
Wear Level Threshold
Global Bad Block Management active
Global Wear Leveling active
00h
Data structure checksum
The byte order for the multi-byte values is little endian (least significant byte first), unless specified otherwise.
There are six attributes that are defined in the CF card. These return their data in the attribute section of the
SMART data, using a 12 byte data field.
The field at offset 386 gives a version number for the contents of the SMART data structure. In version 0, the spare
block counts (offsets 4 to 11) in the Spare Block Count attribute need to be byte-swapped.
The byte at offset 396 is 0 if the wear leveling has not yet started its global operation and 1 if the global wear
leveling has started. This happens when the most used chip has reached the erase count threshold defined in the
Erase Count Attribute.
The byte at offset 397 is 0 if the bad block management is still working chip local, and 1 if the global bad block
management has started. This happens when one of the flash chips runs out of spare blocks, in this case spare
blocks from different flash chips are used.
In the following sections the Attributes for different SMART structure versions (Byte 0..1) are specified that depend
on the firmware. In version 0x0010 the worst value at offset 3 were added and other data were shifted.
11.3.1 SMART Attributes for SMART structure version 0004h
11.3.1.1 Spare Block Count Attribute
This attribute gives information about the amount of available spare blocks.
Table 113: Spare Block Count Attribute for SMART structure version 0004h
Offset
0
1..2
3
4..5
6..7
8..9
10..11
Value
c4h
0003h
Description
Attribute ID – Reallocation Count
Flags – Pre-fail type, value is updated during normal operation
Attribute value. The value returned here is the minimum percentage of remaining
spare blocks over all flash chips, i.e. min over all chips (100 × current spare blocks
/ initial spare blocks)
initial number of spare blocks of the flash chip that has been used for the
attribute value calculation
current number of spare blocks of the flash chip that has been used for the
attribute value calculation
sum of the initial number of spare blocks for all flash chips
sum of the current number of spare blocks for all flash chips
Swissbit AG
Industriestrasse 4
Swissbit reserves the right to change products or specifications without notice.
Revision: 1.20
CH-9552 Bronschhofen
Switzerland
www.swissbit.com
industrial@swissbit.com
C-320_data_sheet_CF-HxBO_Rev120.doc
Page 83 of 101
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